Surface analysis of zeolites: An XPS, variable kinetic energy XPS, and low energy ion scattering study
نویسندگان
چکیده
منابع مشابه
LOW-ENERGY-ION ENHANCED DIFFUSION AT THE SURFACE OF METALS
Radiation enhanced diffusion at the surface of metals has been observed and studied for low-energy nitrogen ions at the surface of copper. The displacement of the target atoms during irradiation creates vacancies and other defects near the surface, thus enhancing the diffusion of implanted materials toward the surface and also into the solid. The mechanism has been studied here by a specia...
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We report on the design, construction, and performance of a high current monolayers/ s , mass-filtered ion beamline system for surface scattering studies using inert and reactive species at collision energies below 1500 eV. The system combines a high-density inductively coupled plasma ion source, high-voltage floating beam transport line with magnet mass-filter and neutral stripping, decelerato...
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The effect of the irradiation with Al Ka X-rays during an XPS measurement upon the surface vanadium oxidation state of a fresh in vacuum cleaved V2O5(001) crystal was examined. Afterwards, the surface reduction of the V2O5(001) surface under Ar + bombardment was studied. The degree of reduction of the vanadium oxide was determined by means of a combined analysis of the O1s and V2p photoelectron...
متن کاملlow-energy-ion enhanced diffusion at the surface of metals
radiation enhanced diffusion at the surface of metals has been observed and studied for low-energy nitrogen ions at the surface of copper. the displacement of the target atoms during irradiation creates vacancies and other defects near the surface, thus enhancing the diffusion of implanted materials toward the surface and also into the solid. the mechanism has been studied here by a special met...
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A program for quantitative evaluation of x-ray photoelectron spectra has been developed to serve as a practical tool for surface chemists. The program uses the ‘classic’ approach of quantification and requires as input the integrated intensities of the measured XPS lines. The usual correction methods and factors can be applied and controlled independently. All necessary basic data for calculati...
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ژورنال
عنوان ژورنال: Surface Science
سال: 2016
ISSN: 0039-6028
DOI: 10.1016/j.susc.2015.10.048